Ключевые слова: HTS, coated conductors, tapes, YBCO, thin films, pinning centers artificial, doping effect, nanorods, nanoscaled effects, growth rate, fabrication, targets, PLD process, substrate SrTiO3, X-ray diffraction, microstructure, magnetization, pinning force, critical caracteristics, critical current density, angular dependence, experimental results, modeling, numerical analysis, comparison
Huhtinen H., Paturi P., Driessche I.V., Palonen H., Rijckaert H., Khan M.Z., Aye M.M., Rivasto E., Salojarvi E., Haalisto C., Makila E.
Ключевые слова: LTS, thin films, PLD process, X-ray diffraction
Ключевые слова: HTS, YBCO, films, multilayered structures, doping effect, defects columnar, nanoscaled effects, critical caracteristics, critical current density, angular dependence, magnetic field dependence, microstructure, pinning mechanism, mechanical properties, thickness dependence, strain effects, experimental results
Chen C., Zhao Y., Huhtinen H., Paturi P., Zhu J., Wu Y., Palonen H., Khan M.Z., Rivasto E., Tikkanen J.
Ключевые слова: HTS, YBCO, coated conductors, doping effect, fabrication, IBAD process, buffer layers, cap layers, template layers, critical caracteristics, critical current, anisotropy, lattice parameter, magnetization, temperature dependence, critical current, angular dependence, Jc/B curves, microstructure, defects, experimental results
Huhtinen H., Paturi P., Driessche I.V., Malmivirta M., Rijckaert H., Hynninen T., Khan M.Z., Aye M.M., Rivasto E.
Ключевые слова: thin films, substrate SrTiO3, PLD process, pinning, pinning centers artificial, angular dependence, defects columnar, size effect, nanoscaled effects, vortex dynamics, lattice parameter, critical temperature, critical caracteristics, critical current density, Jc/B curves, pinning force, experimental results, HTS, YBCO
Huhtinen H., Paturi P., Driessche I.V., Wagner A., Malmivirta M., Rijckaert H., Khan M.Z., Rivasto E., Tikkanen J., Liedke M.O., Butterling M.
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